Domande di colloquio per Realtime Defect Analysis RDA Engineer presso Micron Technology

How would you identify a true excursion and isolate it from noise? Explain the semiconductor manufacturing steps When would you use a dark field tool vs bright field tool? How does a bright field tool work and how does a dark field tool work? Explain how does a bright field provide you data? How does a tool determine whether the defect is truly a defect and isolate it from noise? If I have a silicon wafer and put Metal lines on that wafer , walk me through the process steps to go from Silicon to Metal lines? What is your experience with inspection tool sets? Have you personally used them? Whats your experience submitting FA? How do you design a DOE? Why do we use multiple variables to design a DOE instead of one variable?